发明名称 Planar measuring instrument
摘要 A planar measuring instrument is disclosed for determining the deviations from the straightness or planeness of parts, the instrument including a laser beam and a measuring sensor which is displaceable transversely to the measuring direction, both of which are enclosed in an elongated, preferably evaculated, hollow body. In one disclosed embodiment, the laser beam impinges on a photo detector associated with the planar sensing bolt whose output signals cooperate with an electromagnet associated with the planar sensing bolt to compensate for guidance errors. In another series of embodiments, the laser beam is separated into partial beams. One of these partial beams impinges on reference detectors located at the end of the measuring path with the output of said reference detectors being used to drive a servo system which adjusts the direction of the laser beam and reference line determined by it. The other partial beam is used for cooperation with the measuring sensor system.
申请公布号 US4120093(A) 申请公布日期 1978.10.17
申请号 US19760734536 申请日期 1976.10.21
申请人 DR. JOHANNES HEIDENHAIN GMBH 发明人 SPIES, ALFONS
分类号 G01B5/00;G01B7/00;G01B11/00;G01B11/24;G01B11/30;(IPC1-7):G01B7/34 主分类号 G01B5/00
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