发明名称 |
Binary inspection probe for numerically controlled machine tools |
摘要 |
An inspection probe is mounted in the spindle of a numerically controlled machine tool and is moved toward a workpiece therein by the numerical controls until it makes contact with the workpiece. Contact with the workpiece is indicated by change in the output signal of a portable transmitter mounted within the toolholder that carries the inspection probe. The change in output amplitude causes the instantaneous position of the spindle to be recorded in the numerical controls at the instant of contact between the inspection probe and workpiece to indicate the corresponding dimension of the workpiece. Movement of the spindle is stopped after contact between the inspection probe and workpiece to avoid damage to either the inspection probe or the workpiece.
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申请公布号 |
US4118871(A) |
申请公布日期 |
1978.10.10 |
申请号 |
US19780805914 |
申请日期 |
1978.06.13 |
申请人 |
KEARNEY & TRECKER CORPORATION |
发明人 |
KIRKHAM, EDWARD E. |
分类号 |
G01B7/008;(IPC1-7):G01B7/00;G01B7/28 |
主分类号 |
G01B7/008 |
代理机构 |
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代理人 |
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