发明名称 Process for producing integrated circuit devices by ion implantation
摘要 In this process of producing a bipolar transistor, all the regions of the device except the emitter region are formed by ion implantation through an inorganic dielectric layer of uniform thickness. Subsequently, all the contact openings to the emitter, base and collector are formed and the emitter is implanted through the emitter contact opening. This unique combination of process steps permits the use of a surface insulating dielectric layer of uniform thickness, wherein all capacitances are uniform and controllable while still permitting direct implantation of the emitter, which, because of its shallow depth is difficult to implant through an oxide.
申请公布号 US4118250(A) 申请公布日期 1978.10.03
申请号 US19770865805 申请日期 1977.12.30
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 HORNG, CHENG TZONG;MICHEL, ALWIN EARL;RUPPRECHT, HANS STEPHAN;SCHWENKER, ROBERT OTTO
分类号 H01L29/73;H01L21/033;H01L21/265;H01L21/331;H01L21/76;(IPC1-7):H01L21/26;H01L21/22 主分类号 H01L29/73
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