发明名称 Magnetic lens system for electron microscope - has adjusting system for angular variations of axial alignment of magnetic field coils
摘要 <p>The lens system has a current coil and has two screening cylinders of coaxial arrangement. The screening cylinders are of superconductive material and have bore for the passage of the electron beam. They are in thermal contact with cryogenic substance, as in 1564714. The cylinder faces are spaced, and the gap is free of screening. The gap is rated for a minimum opening fault constant. The electron beam passage bore diameter is kept at the minimum required value. In order to change the angle of the axial alignment of the lens coils (3), adjusting elements are provided effective relative to the axis (11) of symmetry of the lens system. The adjusting elements are preferably in the form of screws radially distributed over the circumference of the coil to be adjusted, these screws being adjustable independently.</p>
申请公布号 DE2059417(B2) 申请公布日期 1978.09.21
申请号 DE19702059417 申请日期 1970.12.02
申请人 SIEMENS AG, 1000 BERLIN UND 8000 MUENCHEN 发明人 DIETRICH, ISOLDE, DIPL.-PHYS. DR., 8000 MUENCHEN;WEYL, REINHARD, DIPL.-PHYS. DR., 8019 ASSLING;ZERBST, HELMUT, 8000 MUENCHEN
分类号 H01F6/00;H01J37/141;(IPC1-7):H01J37/14 主分类号 H01F6/00
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