发明名称 Gate controlled diode protection for drain of IGFET
摘要 An integrated circuit includes an insulated-gate field effect transistor and a protection device coupled to either the source or drain of the transistor. The protection device includes a gate-controlled diode having a breakdown voltage that is less than the breakdown voltage of the drain of the field effect transistor.
申请公布号 US4115709(A) 申请公布日期 1978.09.19
申请号 US19770768897 申请日期 1977.02.15
申请人 NIPPON ELECTRIC CO., LTD. 发明人 INOUE, YASUKAZU;KIKUCHI, MASANORI
分类号 H01L27/02;(IPC1-7):H01L27/04;H01L29/78;H01L29/90 主分类号 H01L27/02
代理机构 代理人
主权项
地址