Multicontact test probe apparatus

摘要

A test probe apparatus having a housing movable into engagement with a printed circuit device connected to a circuit board with a plurality of electrical contact members extending at various angles to the circuit board, and a plurality of contact probes mounted by said housing for engaging each of said contact members with a constant force insufficient to damage their connection to the circuit device, and a mounting device for holding the housing in engagement with the circuit device while attached to the printed circuit board.