Micrometer for measuring distance between workpiece and reference - uses transducer position and stored reference signal comparison for automatic positioning

摘要

A micrometer for measurement of a dimensional distance between a workpiece and a reference inside a very large measurement zone has one or more micrometer gauges with a sensing arm movable w.r.t. the gauge body and a transducer generating a voltage corresp. to arm displacement. It is designed for rapid precise gauge positioning in defined working positions. A store contains a value corresp. to arm displacement at the reference point which is added to the first transducer signal in an algebraic adder connected to an indicator. A second store contains the gauge position reference which is compared with a working position signal used for moving the gauge by a transport mechanism, in a comparator which outputs a gauge movement blocking signal when the desired position is reached.