发明名称 Ion scattering spectrometer with modified bias
摘要 An ion scattering spectrometer (ISS) providing enhanced sensitivity, reduced background, and preferential detection of low-mass scattered ions over that of high-mass sputtered ions is disclosed. These advantages are accomplished by a biasing arrangement which maintains a potential difference between the analyzer exit and the detector input at less than 30 volts and substantially eliminates the high potential provided on detector inputs of prior art ion scattering spectrometers which attracted and thereby accelerated ions prior to impinging on the inputs.
申请公布号 US4107526(A) 申请公布日期 1978.08.15
申请号 US19770758836 申请日期 1977.01.12
申请人 MINNESOTA MINING AND MANUFACTURING COMPANY 发明人 MCKINNEY, JAMES T.;RUSCH, THOMAS W.
分类号 G01N23/227;G01N23/22;G01Q30/20;H01J37/252;H01J49/14;H01J49/44;H01J49/48;(IPC1-7):H01J35/00 主分类号 G01N23/227
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