| 摘要 |
An electronic bin temperature monitor is disclosed which automatically scans a plurality of temperature sensors which are disposed about the interior of a grain storage bin so that the temperatures at various locations in the stored grain can be monitored. The temperature sensors, which are selected silicon diodes with a linear negative temperature coefficient, are connected by cables to an external monitoring unit, which is provided with digital readouts to display both the location number of the sensor at which the temperature is being read and the temperature at that sensor location. Also provided, in common to all the sensors in a particular bin, is a pre-set alarm function which causes an external alarm device to be triggered, whenever any individual sensor temperature reaches or exceeds a pre-set temperature.
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