发明名称 DEVICE TEST UNIT
摘要 PURPOSE:To enable the retrieval of the device having higher performance, by enabling that the operating speed of the reference device is made different from that of the tested device, in device comparison methods.
申请公布号 JPS5382144(A) 申请公布日期 1978.07.20
申请号 JP19760158852 申请日期 1976.12.27
申请人 NIPPON ELECTRIC CO 发明人 SANO TOUSHI
分类号 G01R31/28;G06F11/00;G06F11/22 主分类号 G01R31/28
代理机构 代理人
主权项
地址