| 摘要 |
A parity checking scheme for detecting memory array word line failures whereby all of the data and parity bits of a plurality of bytes sharing the same word line erroneously assume the value "1" or the value "0". When storing data in the array, the data and parity bits comprising each byte are stored directly except for the parity bit of a selected one of the bytes, which parity bit is inverted by a gated inverter circuit before storing. The same gated inverter circuit also inverts the parity bit of the selected byte upon reading the stored data. All of the remaining bits of all of the remaining bytes are read directly. The read bits of each byte are applied to a respective parity checking circuit of the same even or odd parity type as is used in storing the data. The outputs of all of the parity checking circuits are applied to error control logic. |
