Error location apparatus and methods

摘要

Location of multiple symbols in error is enhanced by using affine polynomial-based apparatus and methods. An algebraic trace function 0 (vector) provides a test for whether or not the location polynomial has roots in the field of interest. The selected roots then combine with previously calculated error-indicating syndromes to indicate symbols in error. Informational states developed for error location are employed to generate error patterns. Preferred apparatus includes a sequenced and buffered special purpose finite field processor, either of the random logic, array