发明名称 Semiconductor scribing method
摘要 This relates to the scribing and breaking of a semiconductor wafer into individual dies by anodizing the silicon in regions corresponding to the die boundaries. The regions are selectively anodized, and the anodization is continued until the anodized silicon extends into the semiconductor wafer to a depth that allows easy breakage when the wafer is stressed. To facilitate breakage, the anodized silicon may be removed with hydrofluoric acid.
申请公布号 US4096619(A) 申请公布日期 1978.06.27
申请号 US19770764095 申请日期 1977.01.31
申请人 INTERNATIONAL TELEPHONE & TELEGRAPH CORPORATION 发明人 COOK, JR., CHARLES R.
分类号 B23P17/00;H01L21/301;H01L21/311;H01L21/316;H01L21/78;(IPC1-7):B23P17/00 主分类号 B23P17/00
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