发明名称 Ion implanted Schottky barrier diode
摘要 A Schottky barrier diode having a subsurface metalsemiconductor rectifying barrier with electrical rectification properties immune to semiconductor surface contamination. A special ion implantation technique is used to produce a very thin but strongly metallic island-like region in a semiconductive body. A Schottky barrier separates the region from the semiconductive body below the semiconductor body surface. A special truncated Gaussian profile in metal concentration through the thickness of the region provides low thermal and electrical resistance between the Schottky barrier and the region surface.
申请公布号 US4096622(A) 申请公布日期 1978.06.27
申请号 US19770759324 申请日期 1977.01.14
申请人 GENERAL MOTORS CORPORATION 发明人 MACIVER, BERNARD A.
分类号 H01L21/265;H01L21/285;H01L29/167;H01L29/47;H01L29/872;(IPC1-7):B01J7/00 主分类号 H01L21/265
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