发明名称 |
Irradiation analysis of fluorescent material - includes measurement of simulated fluorescent radiation and integration over specified decay period |
摘要 |
<p>The material is irradiated with radiation of a wavelength to stimulate flourescence in the material and of a strength sufficient to bleach the material. Detectors pick up fluorescent emission produced during bleaching by the radiation and generate a signal with a parameter proportional to the instantaneous value of the intensity of fluorescent emission. The time interval required for the fluorescent emission to face to a predetermined fraction of its initial intensity is measured. The fluorescent emission signal is integrated over this time interval.</p> |
申请公布号 |
DE2656632(A1) |
申请公布日期 |
1978.06.15 |
申请号 |
DE19762656632 |
申请日期 |
1976.12.14 |
申请人 |
BLOCK ENGINEERING,INC. |
发明人 |
HIRSCHFELD,TOMAS |
分类号 |
G01N21/64;(IPC1-7):01N21/52 |
主分类号 |
G01N21/64 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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