| 摘要 |
The system herein includes a unique array of light beam reflecting surfaces and reflection control means for effecting changes in the position of a light beam along the scan-line output surface of the system with a much higher degree of sensitivity than is possible with more well known line scan light beam deflection systems. This is accomplished primarily by allowing the reflection control means within the array of reflecting surfaces to be utilized repeatedly in effecting a given change in the position of a light beam at any given time.
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