| 摘要 |
A monitor for checking a plurality of multi-bit digital patterns generated by a system being monitored to determine that each pattern is valid, that each of the patterns appear in the right sequence and that the total number of valid patterns detected during the testing cycle is as expected is disclosed. Additionally, the bit patterns are monitored to detect unexpected transitions. The results of these tests are then combined to form a composite malfunction signal indicative of the operational status of the system being monitored. |
