摘要 |
A normalized count from a digital computer in a layer-thickness measuring device of the beta ray back-scatter type, is fed to a digital-analog converter and a correction circuit which realizes the function Xn corr = Xn+A a2Xnp(1-xn)q and then to an indicator having a non-linear scale, in which Xn is the normalized count, A is a dimensionless number between +1 and -1, a2 is a dimensionless number between +0.1 and -0.1, and p and q are dimensionless positive values around unity but different from one another which are permanently wired into the correction circuit.
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