发明名称 Device for measuring the thickness of layers with a radionuclide irradiating the layer
摘要 A normalized count from a digital computer in a layer-thickness measuring device of the beta ray back-scatter type, is fed to a digital-analog converter and a correction circuit which realizes the function Xn corr = Xn+A a2Xnp(1-xn)q and then to an indicator having a non-linear scale, in which Xn is the normalized count, A is a dimensionless number between +1 and -1, a2 is a dimensionless number between +0.1 and -0.1, and p and q are dimensionless positive values around unity but different from one another which are permanently wired into the correction circuit.
申请公布号 US4089054(A) 申请公布日期 1978.05.09
申请号 US19760691039 申请日期 1976.05.28
申请人 OTT, ALBERT 发明人 OTT, ALBERT
分类号 G01B15/02;G01N23/203;G01Q60/22;(IPC1-7):G06F15/20;G01N23/20 主分类号 G01B15/02
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