| 发明名称 |
TEST CIRCUIT FOR MULTIIFREQUENCY SIGNAL |
| 摘要 |
PURPOSE:To secure a quick detection for the faaulty telephone set by detecting the abnormal area of the level difference for PB signals to each other. |
| 申请公布号 |
JPS5347708(A) |
申请公布日期 |
1978.04.28 |
| 申请号 |
JP19760122639 |
申请日期 |
1976.10.13 |
| 申请人 |
NIPPON ELECTRIC CO;NIPPON TELEGRAPH & TELEPHONE |
发明人 |
HIRANO KAZUNARI;TOMIMORI AKINOBU;AYUGASE NOBUHISA;MURAKAMI MASAYUKI |
| 分类号 |
H04Q1/45;H04L27/26;H04M3/26;H04Q1/453 |
主分类号 |
H04Q1/45 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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