| 摘要 |
A microscope especially adapted to inspect the surfaces of holes or the like is provided. A group of objectives having shorter focal lengths and including at least one objective having a magnification less than one-half in order to form an image reduced in size is combined with an eyepiece having a shorter focal length, thereby forming a magnified image. Because of the difference in magnifications at both ends of an increased depth of field, the image is exceedingly distorted so as to permit the inspection of surfaces of holes or the like.
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