发明名称 X-ray examining device
摘要 An X-ray examining device comprises an optical aperture including adjustable sector-like laminations. The laminations are rotatable about axes perpendicular to the optical axis. The edges of the laminations are adapted to the optical system so that proper imaging is maintained in the case of a comparatively small opening of the aperture.
申请公布号 US4085328(A) 申请公布日期 1978.04.18
申请号 US19760733203 申请日期 1976.10.18
申请人 U.S. PHILIPS CORPORATION 发明人 MONTE, GEORGE LEENDERT ADRIAAN
分类号 A61B6/00;A61B6/02;A61B6/06;G21K1/04;(IPC1-7):G21K1/04 主分类号 A61B6/00
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