DISPOSITIF POUR DETERMINER LE PROFIL D'UNE SURFACE

摘要

A device for determining the profile of a surface is disclosed. It comprises a beam arranged in a rotating plane about an axis of rotation, forming on the surface a light spot and scanning a sector of that plane. A detection system whose detection axis is situated in that plane cuts the beam near the surface and a system for measuring the angle formed by the axis of detection and the beam during the scanning when the light spot is situated on the detection axis is utilized.