| 发明名称 |
MEMORY TEST UNIT |
| 摘要 |
PURPOSE:To secure an easy-to-understand information for the position which contains mismemory by constituting the test unit such as ROM which tests the memory contents of a memory in such a way that a test may be performed easily through a simple unit. |
| 申请公布号 |
JPS5333540(A) |
申请公布日期 |
1978.03.29 |
| 申请号 |
JP19760108612 |
申请日期 |
1976.09.09 |
| 申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
HIRASHIMA MASAYOSHI |
| 分类号 |
G11C17/00;G01R31/00;G01R31/28;G06F11/00;G06F11/22;G11C29/00;G11C29/44 |
主分类号 |
G11C17/00 |
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