发明名称 Method of manufacturing a semiconductor device and device manufactured according to the method
摘要 A method of manufacturing a metal silicide pattern with respect to which two electrode zones are to be provided in a self-registering manner. According to the invention the pattern is provided in the form of a layer of polycrystalline silicon and, by selective oxidation and masking, only the upper surface of the pattern is exposed to the silicide formation so that passivation problems and short circuit are avoided. The use of silicides which cannot withstand high temperatures is also possible.
申请公布号 US4080719(A) 申请公布日期 1978.03.28
申请号 US19760721661 申请日期 1976.09.09
申请人 U.S. PHILIPS CORPORATION 发明人 WILTING, HERMANUS JOSEPHUS H.
分类号 H01L21/28;H01L21/336;H01L29/417;H01L29/49;H01L29/78;(IPC1-7):B01J17/00 主分类号 H01L21/28
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