发明名称 Thermic probe system with metal element - has glass enclosure containing vacuum or gas pressure compensated for use in extreme temp. ranges
摘要 <p>A thermic probe comprises a wire (a) fabricated of an appropriate metal which is located in a sealed enclosure (b). The enclosure may be vacuous or filled with inert gas. The wire (a) may be fabricated from the metallic ribbon of a printed circuit board or by a vapourised deposit on a support when the enclosure (b) is vacuous. The enclosure is suitably pressurised or depressurised in dependence upon its intended application to low or high temp. ranges so as to prevent implosion or explosion of the probe in use. The enclosure (b) itself is constructed from glass or metal or ceramics or quartz.</p>
申请公布号 FR2363091(A1) 申请公布日期 1978.03.24
申请号 FR19760025950 申请日期 1976.08.27
申请人 DIETRICH ET CIE DE 发明人
分类号 G01K1/08;G01K7/20;(IPC1-7):01K7/18;01K1/08 主分类号 G01K1/08
代理机构 代理人
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