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发明名称
MEASURING METHOD FOR VARIOUS PARAMETERS OF FIELD EFFECT TRANSISTOR
摘要
申请公布号
JPS5426667(A)
申请公布日期
1979.02.28
申请号
JP19770091742
申请日期
1977.07.29
申请人
NIPPON ELECTRIC CO
发明人
TERADA KAZUO
分类号
H01L29/78;H01L21/66;H01L21/822;H01L27/04
主分类号
H01L29/78
代理机构
代理人
主权项
地址
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