发明名称 MASK ALIGNMENT METHOD TO SEMICONDUCTOR SUBSTRATE
摘要 PURPOSE:To facilitate final alignment by providing rough alignment patterns outside of effective chip regions, using the effective regions in element formation and performing highly accurate rough alignment with the two patterns.
申请公布号 JPS534476(A) 申请公布日期 1978.01.17
申请号 JP19760077856 申请日期 1976.07.02
申请人 FUJITSU LTD 发明人 ABE SHIGEHARU;SUGISHIMA KENJI;TAMURA HIDEO
分类号 H01L21/027;H01L21/302 主分类号 H01L21/027
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