发明名称 TEST SIGNAL GENERATOR
摘要 PURPOSE:Waveform data containg prescribed test signals are stored in a lowspeed memory temporarily and are transferred to a high-speed memory during a signal generation braking period, so that the capacity of expensive high-speed memory can be reduced as mush as possible.
申请公布号 JPS533714(A) 申请公布日期 1978.01.13
申请号 JP19760078046 申请日期 1976.07.01
申请人 TOKYO SHIBAURA ELECTRIC CO 发明人 SAGARA YUUJI
分类号 H04N17/00;G01R31/00;H04B3/46;H04B17/00 主分类号 H04N17/00
代理机构 代理人
主权项
地址