发明名称 |
Glass ceramic contg. thallous oxide to lower softening temp. - so semiconductors contg. gold bonding wires can be encapsulated |
摘要 |
<p>Glass ceramic, esp. for the encapsulation of semiconductor elements, and contg. by wt. 2.5-2.5% SiO2, 7.5-10% B2O3, 70-80% PbO, 10-15% ZnO, 0.5-1.5% F less an equiv. amt. of O2. The material also contains 2.3 mole % Tl2O; the mole ratios PbO:ZnO:B2O3 are 2:1:1; the mole ratios PbF2:Tl2O:SiO2 are 2:1:1; and the mole. ratio-(PbO+ZnO+B2P3):(PbF2+Tl2O+SiO2) is between 8:1 and 10:1. Conventional glass ceramics have transformation point (T) 327-375 degrees C., so the solding or encapsulating temp. is >400 degrees C. But Au and Si form eutectic at 378 degrees C so semiconductors using Au bonding wires cannot be encapsulated. Encapsulation at ca. 350 degrees C. i.e. below the Au-Si eutectic m.pt. is permitted.</p> |
申请公布号 |
DE2628823(A1) |
申请公布日期 |
1977.12.29 |
申请号 |
DE19762628823 |
申请日期 |
1976.06.26 |
申请人 |
STANDARD ELEKTRIK LORENZ AG |
发明人 |
SMERNOS,STAUROS,DR.RER.NAT.;BOEHRINGER,KUNIGUNDE |
分类号 |
C03C8/24;C03C10/00;H01L23/29;(IPC1-7):H01L23/30;C03C3/22 |
主分类号 |
C03C8/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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