Optical harmonic microscope assembly and examination method

摘要

An optical harmonic microscope assembly and an examination method which provides for focusing lased coherent light as an incident beam onto a specimen, disposing the optical path of a microscope and the incident beam at a relative angle in a range which is at least as broad as 0 DEG -90 DEG , blocking the fundamental frequency of the lased light and viewing light of a harmonic of said fundamental frequency generated by nonlinear diffraction by said specimen.