| 摘要 |
A test mode entry/decision circuit for a semiconductor device, a semiconductor device having the same, and a method of entering test mode and determining test mode of a semiconductor device are provided to determine a test mode entry/decision of the semiconductor device without comprising an additional pin for the test mode entry/decision. A test mode entry/decision circuit for a semiconductor device includes a test mode entry determining part(300) and a test mode decoding part(400). The test mode entry determining part generates an internal reset signal on the basis of an external reset signal applied through a reset pin from the outside of the semiconductor device, and generates a test mode determining signal by shifting a low voltage detection signal generated in the semiconductor device. The test mode decoding part generates a test mode signal by decoding the test mode determining signal.
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