发明名称 MASK ALIGNING METHOD
摘要 PURPOSE:To perform highly accurate mask aligning by coinciding second mask alignment patterns which are rotated at a given angle with respect to the mask alignment patterns on an IC circuit, to said mask alignment patterns on the IC circuit and magnifying the deviation in alignment to make its detection easy.
申请公布号 JPS52143770(A) 申请公布日期 1977.11.30
申请号 JP19760060014 申请日期 1976.05.26
申请人 HITACHI LTD 发明人 SUNAMI HIDEO
分类号 H01L21/027;H01L21/302 主分类号 H01L21/027
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