发明名称 THERMAL RESISTANCE MEASURING METHOD OF SEMICONDUCTOR PACKAGES
摘要 PURPOSE:To increase the response speed of the measuring instrument by providing a power supply detection circuit which detects that power is supplied to semiconductors, a delay circuit which is operated by said circuit and a display circuit which receives the output from said delay circuit and subsequently displays the outputs of the measuring circuit and obtaining thermal resistance values at an arbitrary time with the outputs of the display circuit.
申请公布号 JPS52141182(A) 申请公布日期 1977.11.25
申请号 JP19760056648 申请日期 1976.05.19
申请人 FUJITSU LTD 发明人 KISHI KENICHI
分类号 G01R31/26;G01K7/01;G01K7/16 主分类号 G01R31/26
代理机构 代理人
主权项
地址