发明名称 ASSIGNING METHOD OF PATTERN INSPECTION AREAS
摘要 PURPOSE:To assign the inspection chips disposed in matrix form with less informations by dividing an inspection area in plural blocks of a rectangle, and setting the position and size of the block in a mask from the number of chips of X, Y axis components based on the origin provided to each block.
申请公布号 JPS52141177(A) 申请公布日期 1977.11.25
申请号 JP19760056675 申请日期 1976.05.19
申请人 TOKYO SHIBAURA ELECTRIC CO 发明人 HARADA TAKEJI;KIMURA HIROICHI
分类号 G01B11/24;G01N21/956;G03F1/84;H01L21/027;H01L21/302;H01L21/66 主分类号 G01B11/24
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