发明名称 OVERHEAT DETECTION CIRCUIT AND SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an overheat detection circuit which suppresses unintended erroneous output due to disturbance noise such as instant power supply voltage variation and which can quickly output an overheat-state detection signal in an overheat state.SOLUTION: An overheat detection circuit includes: a temperature sensitive part 211; a comparator 212; and a disturbance noise removal part 110 for outputting an overheat-state detection signal to an output part after a predetermined delay time. The delay time is shortened in proportion to temperature.SELECTED DRAWING: Figure 1
申请公布号 JP2016121902(A) 申请公布日期 2016.07.07
申请号 JP20140260737 申请日期 2014.12.24
申请人 SII SEMICONDUCTOR CORP 发明人 SUGIURA SHOICHI;SAWAI HIDEYUKI
分类号 G01K7/01 主分类号 G01K7/01
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