Detector for detecting x-ray radiation parameters

摘要

The present invention relates to an X-ray parameter measuring arrangement comprising a detector for measuring said parameter configured to be positioned in a position adjacent to an x-ray source arranged to generate a ray formation having a primary ray portion for radiating an object. The position is chosen in such a way that the interference with a reproduced image is reduced or eliminated.

主权项

1. An X-ray parameter measuring arrangement comprising a detector for measuring an x-ray parameter, the arrangement being configured to be positioned in a position adjacent to an x-ray source arranged to generate a ray formation for radiating an object, wherein said position is in a primary ray portion such that the interference with a reproduced image is reduced or eliminated, the detector comprising:
a housing; a number of stacked layers enclosed in the housing, the number of stacked layers including at least a first layer comprising a first diode layer and a second layer comprising a second diode layer, wherein the first diode layer and the second diode layer detect the generated ray formation; a radiation filter positioned between said first diode layer and said second diode layer; and a processing unit included as one of said number of stacked layers, wherein the processing unit is:
positioned under said first diode layer and said second diode layer;connected to said first diode layer and said second diode layer; andconfigured to output a signal corresponding to a parameter of the ray formation based on the detection of the ray formation by the first diode layer and the second diode layer.