| 摘要 |
PROBLEM TO BE SOLVED: To suppress deterioration of accuracy of measuring the characteristics of a measurement target.SOLUTION: A terahertz wave measurement device (100) includes: generation means (110) generating a terahertz wave (THz); first optical means (170) with a reflection surface (171) reflecting the terahertz wave generated by the generation means to a measurement target (10); and second optical means (180) facing at least a part of the reflection surface at a position away from the reflection surface by a predetermined distance, for preventing a transmitting light as a terahertz wave having passed through the reflection surface from propagating to the first optical means.SELECTED DRAWING: Figure 1 |
