发明名称 Multi-point test probe
摘要 A multi-point probe head assembly for providing electro-mechanical interface contact with miniature electronic devices and including a rigid support member, a plurality of probe tips each attached to a probe arm, and adjustment means for adjusting the relative position of each probe tip in three orthogonal planes.
申请公布号 US4055805(A) 申请公布日期 1977.10.25
申请号 US19760700489 申请日期 1976.06.28
申请人 PROBE RITE, INC. 发明人 ARDEZZONE, FRANK J.
分类号 G01R1/073;(IPC1-7):G01R31/02;G01R1/06 主分类号 G01R1/073
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