发明名称 CIRCUIT TESTER
摘要 PURPOSE:To promote the efficinecy of the testing, by means of realizing a circuit tester which can perform the starting of test and its termination of individual circuit or the connection changeover of circuit apparatus at an optionally selected time point and can perform a parallel testing of plural numbers of circuit units.
申请公布号 JPS52122446(A) 申请公布日期 1977.10.14
申请号 JP19760039111 申请日期 1976.04.07
申请人 FUJITSU LTD 发明人 TSURUTA MITSUO
分类号 G11C29/00;G01R31/26;G01R31/28;G06F11/22;G11C11/34;G11C29/56 主分类号 G11C29/00
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