| 发明名称 |
COMPARATIVE EXAMINATION METHOD FOR TWOODIMENSIONAL PICTURE |
| 摘要 |
PURPOSE:To provide a two-dimensional picture comparative examination method by which two-dimensional patterns can be checked accurately at a high speed. |
| 申请公布号 |
JPS52119844(A) |
申请公布日期 |
1977.10.07 |
| 申请号 |
JP19760035998 |
申请日期 |
1976.04.02 |
| 申请人 |
HITACHI LTD |
发明人 |
HARA YASUHIKO |
| 分类号 |
G01B11/24;B41F33/14;G06K9/00;G06T1/00;G06T7/00 |
主分类号 |
G01B11/24 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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