发明名称 Circuit arrangement for measuring the phase modulation disturbance of a test signal
摘要 A circuit arrangement for measuring the phase modulation disturbance of a test signal which is passed through a test object and wherein a heterodyne oscillator supplies an input to a mixer which receives the input signal and supplies an output to a detector and display device and wherein the output of the mixer is applied to an automatic frequency control loop including a reference oscillator phase discriminator and a low pass filter which supplies an input to the frequency control input of the heterodyne oscillator.
申请公布号 US4050014(A) 申请公布日期 1977.09.20
申请号 US19760665500 申请日期 1976.03.10
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 FINK, HELMUTH;WESS, GUENTER
分类号 G01R29/06;(IPC1-7):G01R27/00 主分类号 G01R29/06
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