发明名称 Electrical temperature measuring resistor structure, particularly for resistance thermometers
摘要 A substrate carrier of electrically non-conductive material has a strip of resistance platinum applied thereto; in order to avoid the use of an intermediate temperature coefficient of expansion matching layer, the substrate carrier, for example of aluminum oxide, beryllium oxide, or a magnesium silicate, has less than thirty parts per million (ppm) Fe, less than 15 ppm Cr, less than 45 ppm Pb and less than 70 ppm Si in a form capable of reacting with platinum, the sum of the impurities by these metals, if all, or more than one are present, not exceeding 20 ppm; the average thermal coefficient of expansion of the substrate does not deviate from the mean thermal coefficient of expansion of the thermometer grade platinum by more than +/- 30%; the platinum layer has a thickness of from 0.1 to 10 mu m, and is applied at a temperature in the range of between about 1000 DEG C to 1400 DEG C during 60 minutes in an atmosphere containing oxygen, for example free air.
申请公布号 US4050052(A) 申请公布日期 1977.09.20
申请号 US19760695783 申请日期 1976.06.14
申请人 W. C. HERAEUS GMBH 发明人 REICHELT, WALTER;SAUER, GUNTER
分类号 G01K7/18;H01C7/22;H01C17/08;H01C17/12;(IPC1-7):H01C1/01;H01C3/04 主分类号 G01K7/18
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