METHOD OF INSPECTING SECONDARY BATTERY,申请号JP19770025886-传众专利搜索

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发明名称	METHOD OF INSPECTING SECONDARY BATTERY
摘要
申请公布号	JPS52111633(A)	申请公布日期	1977.09.19
申请号	JP19770025886	申请日期	1977.03.09
申请人	SIEMENS AG	发明人	MIHAERU ABERUTO
分类号	G01R31/36;H01M10/48;H02J7/00	主分类号	G01R31/36
代理机构		代理人
主权项
地址

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