| 摘要 |
PURPOSE:To accomplish rapid automatic inspection by extracting the line width infor mation of a current path, distance information between the current paths and symbol information based on the traced result of the contour image element of a film pattern and comparing them with reference data. CONSTITUTION:A contour extraction part 2 receives image information extracted by an image read-in part 1 and extracts a contour image element series. A vectorization part 3 combines the contour image element group in order in a tracing direction to execute vectorization, which is outputted to a contour vector storing part 4 after compressing the information according to linear approximation. A line width extraction part 51 extracts the maximum value, the minimum value and the mean value of the line width information of a connection pattern corresponding to the current path of a board. A distance extraction part 52 extracts the distance informa tion of the mutual connection patterns. A symbol extraction part 53 extracts a symbol for attachment corresponding to the soldered part of the parts on the printed board. The extraction parts 51-53 constitute a pattern information extraction part 5 as a whole. A comparison part 7 compares the data from the extraction part 5 with the data from a reference data input part 6 and gives the compared result to a compared result output part 8. |
