发明名称 TEST METHOD FOR SINGLE CHIP MICROCOMPUTER
摘要 PURPOSE:To test a microcomputer in a state close to real use and to freely change a program for test as well by reading a vector address to the microcomputer from a RAM at the time of testing. CONSTITUTION:A RAM test mode is set and the test program is written to a RAM 1. Next, when a debug signal is changed from 'L' to 'H', an internal reset signal from a reset controller 2 is changed from 'H' to 'L' and a CPU 3 and a peripheral circuit 4 are reset. By setting the debug signal to 'L', the internal reset signal changed from 'L' to 'H' and a reset cycle is started to execute reset processing to the CPU 3. In such a mode, since all the various interruption vector addresses after the reset of the CPU are wholly read from the RAM 1 and a pin A is not allocated to separate action function, the pin A can be utilized as an original terminal.
申请公布号 JPH0336636(A) 申请公布日期 1991.02.18
申请号 JP19890171390 申请日期 1989.07.03
申请人 RICOH CO LTD 发明人 YAGI TSUKASA
分类号 G06F11/22 主分类号 G06F11/22
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