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发明名称
SCANNING TRANSMISSION ELECTRON MICROSCOPE INCLUDING AN IMPROVED IMAGE DETECTOR
摘要
申请公布号
US4038543(A)
申请公布日期
1977.07.26
申请号
US19760696475
申请日期
1976.06.15
申请人
SIEMENS AKTIENGESELLSCHAFT
发明人
KRISCH, BURKHARD;VENEKLASEN, LEE H.;WILLASCH, DIETER
分类号
H01J37/09;H01J37/22;H01J37/28;(IPC1-7):H01J37/26;G01N23/04
主分类号
H01J37/09
代理机构
代理人
主权项
地址
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