Ion current measuring arrangement

摘要

This measuring arrangement minimizes the influence of disuniformities in the first dynode, struck by the beam's ions, of the electron multiplier used in the arrangement. The beam F whose current is to be measured is expanded, for example using a divergent lens, between the analyzer slot and said dynode. In a variant embodiment, the beam is imparted a rapid oscillatory motion which causes it to scan the dynode.