发明名称 Compensated detector system for infrared gas analysers - has double chambers with outputs to differential amplifier
摘要 <p>The analyser, using the chopped light principle, comprises two chambers (1)(2) connected by a coupling (3) containing two detector screens (4) (5). The screens form part of a resistance bridge with variable arms (6)(7) and heater power supply (8). One chamber is aligned with the measurement beam (1), the second (2) being used as a reference. Two further interconnected chambers (1')(2') with similar detectors and bridge circuit (4')(5') are mounted below and in good thermal contact with the first pair of chambers. The output of the second circuit is taken to an amplitude adjustment (11) and phase-shift network (12) and to one input of a differential amplifier (9). The second amplifier input is connected to the first pair of detectors.</p>
申请公布号 DE2557237(A1) 申请公布日期 1977.06.23
申请号 DE19752557237 申请日期 1975.12.19
申请人 H. MAIHAK AG 发明人
分类号 G01N21/37;(IPC1-7):01N21/36 主分类号 G01N21/37
代理机构 代理人
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