发明名称 SURFACE INSPECTION DEVICE
摘要 PURPOSE:To make possible the detection of fine defects such as of painted plates or the like by radiating the surface of an object to be examined with the light of a preset standard pattern, converting the reflected light to video signals and detecting the visibility of the standard pattern contours.
申请公布号 JPS5271289(A) 申请公布日期 1977.06.14
申请号 JP19750148127 申请日期 1975.12.11
申请人 MITSUBISHI ELECTRIC CORP 发明人 INANI TAKAHIKO;KAMEI MITSUHITO
分类号 G01B11/00;G01B11/24;G01N21/84;G01N21/88;G01N21/93 主分类号 G01B11/00
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