发明名称 |
SURFACE INSPECTION DEVICE |
摘要 |
PURPOSE:To make possible the detection of fine defects such as of painted plates or the like by radiating the surface of an object to be examined with the light of a preset standard pattern, converting the reflected light to video signals and detecting the visibility of the standard pattern contours. |
申请公布号 |
JPS5271289(A) |
申请公布日期 |
1977.06.14 |
申请号 |
JP19750148127 |
申请日期 |
1975.12.11 |
申请人 |
MITSUBISHI ELECTRIC CORP |
发明人 |
INANI TAKAHIKO;KAMEI MITSUHITO |
分类号 |
G01B11/00;G01B11/24;G01N21/84;G01N21/88;G01N21/93 |
主分类号 |
G01B11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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