发明名称 Doped oxide buried channel charge-coupled device
摘要 Processes for manufacturing buried channel charge coupled devices (CCDs). After formation of an insulating layer at the surface of the CCD semiconductor substrate, a dopant material, suitable for the formation of the buried channel, is ion implanted into the insulating material. Subsequent diffusion steps cause the dopant to migrate into the underlying surface of the semiconductor substrate so as to define the buried channel region below the substrate surface.
申请公布号 US4024563(A) 申请公布日期 1977.05.17
申请号 US19750609268 申请日期 1975.09.02
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 TASCH, JR., AL F.
分类号 H01L21/225;H01L29/10;H01L29/768;(IPC1-7):H01L29/78;H01L21/26 主分类号 H01L21/225
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